Inverse fourier transform technique to determine second-order optical nonlinearity spatial profiles

Applied Physics Letters

Volumn 82, Issue 9, 2003, Pages 1362-1364

  Ozcan, A ^a   Digonnet, M J F ^a   Kino, G S ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC SPACE CHARGE; FOURIER TRANSFORMS; OPTICAL FILMS; REFRACTIVE INDEX; SILICA;

INVERSE FOURIER TRANSFORMS;

NONLINEAR OPTICS;

EID: 0037416585     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1557789     Document Type: Article

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