Erratum: Inverse Fourier transform technique to determine second-order optical nonlinearity spatial profiles (Applied Physics Letters (2003) 82 (1362))

Applied Physics Letters

Volumn 83, Issue 8, 2003, Pages 1679-

  Ozcan, A ^a   Digonnet, M J F ^a   Kino, G S ^a  

^a STANFORD UNIVERSITY   (United States)

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EID: 0042782714     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1606887     Document Type: Erratum

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