Improved technique to determine second-order optical nonlinearity profiles using two different samples

Applied Physics Letters

Volumn 84, Issue 5, 2004, Pages 681-683

  Ozcan, A ^a   Digonnet, M J F ^a   Kino, G S ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HARTLEY TRANSFORMS; MAKER FRINGE (MR) TECHNIQUE; TOTAL INTERNAL REFLECTIONS (TIR);

ALGORITHMS; DATA PROCESSING; FUNCTIONS; INTERPOLATION; OSCILLATIONS; REFRACTIVE INDEX; SECOND HARMONIC GENERATION; SILICA; THIN FILMS; WAVE PROPAGATION;

FOURIER OPTICS;

EID: 1242309315     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1644622     Document Type: Article

References (8)

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