High accuracy, wide range, rotation angle measurement by the use of two parallel interference patterns

Applied Optics

Volumn 36, Issue 25, 1997, Pages 6190-6195

  Dai, Xiaoli ^a,c   Sasaki, Osami ^a,d   Greivenkamp, John E ^b   Suzuki, Takamasa ^a,d  

^a NIIGATA UNIVERSITY   (Japan)

^b UNIVERSITY OF ARIZONA   (United States)

^c Graduate School of Science and Technology   (Denmark)

^d Faculty of Engineering   (United States)

Author keywords

High accuracy; Interferometry; Rotation angles; Wide range

Indexed keywords

EID: 0000903276     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.006190     Document Type: Article

References (12)

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