In-plane rotation analysis by two-wavelength electronic speckle interferometry

Applied Optics

Volumn 38, Issue 12, 1999, Pages 2467-2470

  Nassim, Abdel Karim ^a,b,c   Joannes, Luc ^a,b   Cornet, Alain ^a,b  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^b FACULTÉ DES SCIENCES   (Morocco)

^c UNIVERSITÉ LIBRE DE BRUXELLES   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042231911     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.002467     Document Type: Article

References (6)

1. C. Wykes, “Use of electronic speckle pattern interferometry (ESPI) in the measurement of static and dynamic surface displacements,” Opt. Eng. 21, 400-406 (1982).
2. J. N. Butters and J. A. Leendertz, “Speckle pattern and holographic techniques in engineering metrology,” Meas. Control 4, 349-354 (1971).
3. O. J. Lokberg, “Electronic speckle pattern interferometry,” Phys. Technol. 11, 16-22 (1980).
4. O. J. Lokberg, and G. A. Slettemoen, “Basic electronic speckle pattern interferometry,” in Applied Optics and Optical Engineering, R. Shannon and J. C. Wyant, eds. (Academic, New York, 1987), pp. 455-504.
5. R. Jones and C. Wykes, Holographic and Speckle Interferometry, 2nd ed. (Cambridge U. Press, Cambridge, 1989).
6. Y. Ishii, J. Chen, and K. Murata, “Digital phase-measuring interferometry with a tunable laser diode,” Opt. Lett. 12, 233-235 (1987).