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Mighty high-T lithography for 65-nm generation contacts
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Optical Microlithography XVI. Edited by Yen, Anthony
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Mighty high-T lithography for 65-nm generation contacts Conley, Will; Montgomery, Patrick K.; Lucas, Kevin; Litt, Lloyd C.; Maltabes, John G.; Dieu, Laurent; Hughes, Gregory P.; Mellenthin, David L.; Socha, Robert J.; Fanucchi, Eric L.; Verhappen, Arjan; Wampler, Kurt E.; Yu, Linda; Schaefer, Erika; Cassel, Shawn; Kuijten, Jan P.; Pijnenburg, Wil; Wiaux, Vincent; Vandenberghe, Geert; Optical Microlithography XVI. Edited by Yen, Anthony. Proceedings of the SPIE, Volume 5040, pp. 1210-1219 (2003).
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OPC and Source Optimization Robert Socha, Xuelong Shi, Will Conley*, Tom Laidig, Uwe Hollerbach, Kurt Wampler IEEE Lithography Workshop, Whistler B.C. (2004)
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Critical evaluation of photomask needs for competing 65-nm node RET options Progler
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Critical evaluation of photomask needs for competing 65-nm node RET options Progler, Christopher J.; Xiao, Guangming; Optical Microlithography XVI. Edited by Yen, Anthony. Proceedings of the SPIE, Volume 5040, pp. 171-181 (2003).
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Impact of lithography variability on statistical timing behavior
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Design and Process Integration for Microelectronic Manufacturing II. Edited by Liebmann, Lars W.
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Impact of lithography variability on statistical timing behavior Progler, Christopher J.; Borna, Amir; Blaauw, David; Sixt, Pierre; Design and Process Integration for Microelectronic Manufacturing II. Edited by Liebmann, Lars W. Proceedings of the SPIE, Volume 5379, pp. 101-110 (2004).
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Principle of equivalence between scanning and conventional optical imaging systems Kermisch, D.; J. Opt. Soc. Am. 67(10): 1357-60.
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