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Volumn 5754, Issue PART 1, 2005, Pages 315-326

Layout and source dependent transmission tuning

Author keywords

High transmission mask; Image optimization; Logic circuits; Resolution enhancement technology; Source optimization

Indexed keywords

HIGH TRANSMISSION MASKS; IMAGE OPTIMIZATION; RESOLUTION ENHANCEMENT TECHNOLOGY; SOURCE OPTIMIZATION;

EID: 25144511363     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.601770     Document Type: Conference Paper
Times cited : (14)

References (9)
  • 1
    • 0035758402 scopus 로고    scopus 로고
    • Optimum mask and source patterns to print a given shape Rosenbluth
    • Optical Microlithography XIV, Christopher J. Progler; Ed
    • Optimum mask and source patterns to print a given shape Rosenbluth, Alan E.; Bukofsky, Scott J.; Hibbs, Michael S.; Lai, Kafai; Molless, Antoinette F.; Singh, Rama N.; Wong, Alfred K.; Proc. SPIE Vol. 4346, p. 486-502, Optical Microlithography XIV, Christopher J. Progler; Ed
    • Proc. SPIE , vol.4346 , pp. 486-502
    • Alan, E.1    Bukofsky, S.J.2    Hibbs, M.S.3    Lai, K.4    Molless, A.F.5    Singh, R.N.6    Wong, A.K.7
  • 5
    • 0141833791 scopus 로고    scopus 로고
    • Critical evaluation of photomask needs for competing 65-nm node RET options Progler
    • Optical Microlithography XVI. Edited by Yen, Anthony
    • Critical evaluation of photomask needs for competing 65-nm node RET options Progler, Christopher J.; Xiao, Guangming; Optical Microlithography XVI. Edited by Yen, Anthony. Proceedings of the SPIE, Volume 5040, pp. 171-181 (2003).
    • (2003) Proceedings of the SPIE , vol.5040 , pp. 171-181
    • Christopher, J.1    Xiao, G.2
  • 6
    • 2942674847 scopus 로고    scopus 로고
    • Impact of lithography variability on statistical timing behavior
    • Design and Process Integration for Microelectronic Manufacturing II. Edited by Liebmann, Lars W.
    • Impact of lithography variability on statistical timing behavior Progler, Christopher J.; Borna, Amir; Blaauw, David; Sixt, Pierre; Design and Process Integration for Microelectronic Manufacturing II. Edited by Liebmann, Lars W. Proceedings of the SPIE, Volume 5379, pp. 101-110 (2004).
    • (2004) Proceedings of the SPIE , vol.5379 , pp. 101-110
    • Progler, C.J.1    Borna, A.2    Blaauw, D.3    Sixt, P.4
  • 7
    • 0042620345 scopus 로고    scopus 로고
    • Principle of equivalence between scanning and conventional optical imaging systems
    • Principle of equivalence between scanning and conventional optical imaging systems Kermisch, D.; J. Opt. Soc. Am. 67(10): 1357-60.
    • J. Opt. Soc. Am. , vol.67 , Issue.10 , pp. 1357-1360
    • Kermisch, D.1
  • 9
    • 0035758412 scopus 로고    scopus 로고
    • High-transmission attenuated PSM as a viable optical extension technique
    • Optical Microlithography XIV, Christopher J. Progler; Ed.
    • High-transmission attenuated PSM as a viable optical extension technique Kachwala, Nishrin; Proc. SPIE Vol. 4346, p. 806-816, Optical Microlithography XIV, Christopher J. Progler; Ed.
    • Proc. SPIE , vol.4346 , pp. 806-816
    • Kachwala, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.