Adsorption and desorption isotherms at ambient temperature obtained by ellipsometric porosimetry to probe micropores in ordered mesoporous silica films

Adsorption

Volumn 11, Issue 1 SUPPL., 2005, Pages 195-199

  Bourgeois, Alexis ^a   Brunet Bruneau, Aline ^a   Fisson, Serge ^a   Rivory, Josette ^a   Matheron, Muriel ^b   Gacoin, Thierry ^b   Boilot, Jean Pierre ^b  

^a CNRS   (France)

^b LABORATOIRE DE PHYSIQUE DE LA MATIÈRE CONDENSÉE   (France)

Author keywords

Adsorption; Ellipsometry; Mesoporous; Microporous; Silica

Indexed keywords

DESORPTION; ELLIPSOMETRY; MICROPOROUS MATERIALS; POROSIMETERS; SILICA; SURFACE ACTIVE AGENTS; THIN FILMS;

POROUS THIN FILMS; SILICA FILMS; SURFACTANT TEMPLATING;

ADSORPTION ISOTHERMS;

EID: 25144463641     PISSN: 09295607     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10450-005-5922-7     Document Type: Conference Paper

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