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European Physical Journal D

Volumn 35, Issue 2, 2005, Pages 437-441

Microarray technology for the study of DNA damage by low-energy electrons

(3) Solomun, T a Hultschig, C b Illenberger, E a

a FREIE UNIVERSITÄT BERLIN (Germany)

b MAX PLANCK INSTITUTE FOR MOLECULAR GENETICS (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DNA; GENES; OLIGONUCLEOTIDES; RADIATION DAMAGE;

COMPLEMENTARY STRAND; DNA ARRAY; DNA DAMAGES; GENETIC INFORMATION; GOLD SURFACES; HIGH QUALITY; LOW ENERGY ELECTRONS; LOWER ENERGIES; MICROARRAY TECHNOLOGIES; SECONDARY ELECTRONS;

ELECTRONS;

EID: 24944570567 PISSN: 14346060 EISSN: 14346079 Source Type: Journal
DOI: 10.1140/epjd/e2005-00204-8 Document Type: Article

Times cited : (22)

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