Morphological instability of elastic thin films-effect of electromechanical interaction

Applied Physics Letters

Volumn 87, Issue 11, 2005, Pages

  Yang, Fuqian ^a   Song, Wei ^a  

^a UNIVERSITY OF KENTUCKY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC THIN FILMS; ELECTROMECHANICAL INTERACTIONS; SPATIAL WAVELENGTHS; SURFACE EVOLUTION;

DISPERSION (WAVES); ELASTICITY; ELECTROMECHANICAL DEVICES; MORPHOLOGY; PERTURBATION TECHNIQUES; SURFACE PHENOMENA;

THIN FILMS;

EID: 24944477419     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2045544     Document Type: Article

References (17)

1. S. Y. Chou and L. Zhuang, J. Vac. Sci. Technol. B 17, 3197 (1999).
2. E. Schäffer, T. Thurn-Albrecht, T. P. Russell, and U. Steiner, Nature (London) 403, 874 (2000).
3. E. Schäffer, T. Thurn-Albrecht, T. P. Russell, and U. Steiner, Europhys. Lett. 53, 518 (2001).
4. Z. Lin, T. Kerle, S. M. Baker, D. A. Hoagland, E. Schäffer, T. Thurn-Albrecht, U. Steiner, and T. P. Russell, J. Chem. Phys. 114, 2377 (2001).
5. L. F. Pease and W. B. Russel, J. Chem. Phys. 118, 3790 (2003).
6. Z. Suo and J. Liang, Appl. Phys. Lett. 78, 3971 (2001).
7. D. Du and D. Srolovitz, Appl. Phys. Lett. 85, 4917 (2004).
8. R. J. Asaro and W. A. Tiller, Metall. Trans. 3, 1789 (1972).
9. D. J. Srolovitz, Acta Metall. 37, 621 (1989).
10. W. D. Nix, Metall. Trans. A 20A, 2217 (1989).
11. B. J. Spencer, P. W. Voorhees, and S. H. Davis, Phys. Rev. Lett. 67, 3696 (1991).
12. L. B. Freund, Int. J. Solids Struct. 32, 911 (1995).
13. F. Q. Yang, Proceeding of MM2003, Hong Kong, 2003, p. 72.
14. L. D. Landau and E. M. Lifshitz, Electrodynamics of Continuous Media (Pergamon, Oxford 1960).
15. W. W. Mullins, J. Appl. Phys. 30, 77 (1959).
16. L. Klinger and L. Levin, J. Appl. Phys. 78, 1669 (1995).
17. F. Q. Yang, X. Zhang, and J. C. M. Li, Mater. Res. Soc. Symp. Proc. 649, Q6.5.1 (2001).