An eigenvalue-based similarity measure and its application in defect detection

Image and Vision Computing

Volumn 23, Issue 12, 2005, Pages 1094-1101

  Tsai, Du Ming ^a   Yang, Ron Hwa ^a  

^a YUAN ZE UNIVERSITY   (Taiwan)

Author keywords

Defect detection; Eigenvalues; Similarity measure; Template matching

Indexed keywords

APPROXIMATION THEORY; EIGENVALUES AND EIGENFUNCTIONS; MAPS; MATRIX ALGEBRA; NONLINEAR SYSTEMS; PRINTED CIRCUIT BOARDS;

DEFECT DETECTION; GRAY-LEVEL IMAGES; SIMILARITY MEASURE; TEMPORAL MATCHING;

IMAGE ANALYSIS;

EID: 24944476883     PISSN: 02628856     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.imavis.2005.07.014     Document Type: Article

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