Wavelet-based printed circuit board inspection algorithm

Integrated Computer-Aided Engineering

Volumn 12, Issue 2, 2005, Pages 201-213

  Ibrahim, Zuwairie ^a   Al Attas, Syed Abdul Rahman ^b  

^a MEIJI UNIVERSITY   (Japan)

^b UNIVERSITI TEKNOLOGI MALAYSIA   (Malaysia)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ELECTRONIC EQUIPMENT MANUFACTURE; ELECTRONICS INDUSTRY; IMAGE CODING; INSPECTION; WAVELET TRANSFORMS;

ELECTRONIC MANUFACTURING INDUSTRY; HAAR WAVELET TRANSFORM; IMAGE DIFFERENCE; RUN LENGTH ENCONDING (RLE);

PRINTED CIRCUIT BOARDS;

EID: 17444372791     PISSN: 10692509     EISSN: None     Source Type: Journal    
DOI: 10.3233/ica-2005-12206     Document Type: Article

References (18)

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