|
Volumn 15, Issue 4, 2001, Pages 675-690
|
Fast search algorithms for industrial inspection
|
Author keywords
Alignment; Computer vision; Defect detection; Digital image processing; Normalized cross correlation; Similarity measure; Subpixel accuracy; Visual inspection
|
Indexed keywords
ALGORITHMS;
DYNAMIC PROGRAMMING;
INDUSTRIAL APPLICATIONS;
INTEGRATED CIRCUIT TESTING;
OPTIMIZATION;
SAMPLING;
SEARCH ALGORITHMS;
COMPUTER VISION;
|
EID: 0035360048
PISSN: 02180014
EISSN: None
Source Type: Journal
DOI: 10.1142/S0218001401001039 Document Type: Article |
Times cited : (14)
|
References (16)
|