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Volumn 118, Issue 1-4, 1996, Pages 29-33
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Study of implantation damage ranges in metals at temperatures ranging from 5 to 300 K
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Author keywords
[No Author keywords available]
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Indexed keywords
ARGON;
BACKSCATTERING;
COPPER;
CRYSTAL DEFECTS;
GEOMETRY;
IONS;
PARTICLE BEAM DYNAMICS;
SILVER;
SINGLE CRYSTALS;
PARTICLE CHANNELING;
POINT DEFECT MIGRATION PROCESSES;
ION IMPLANTATION;
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EID: 0030565129
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/0168-583X(96)01187-1 Document Type: Article |
Times cited : (11)
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References (14)
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