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Applied Surface Science

Volumn 252, Issue 1 SPEC. ISS., 2005, Pages 245-251

Shells on nanowires detected by analytical TEM

(2) Thomas, Jürgen a Gemming, Thomas a

a IFW DRESDEN (Germany)

Author keywords

Analytical TEM; Model for linescan profiles; Nanotubes; Nanowires

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; MATERIALS SCIENCE; MATHEMATICAL MODELS; NANOTUBES; SHELLS (STRUCTURES); TRANSMISSION ELECTRON MICROSCOPY;

ANALYTICAL TEM; INELASTIC SCATTERING; MODEL FOR LINESCAN PROFILES; NANOWIRES;

NANOSTRUCTURED MATERIALS;

EID: 24644511695 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2005.02.009 Document Type: Conference Paper

Times cited : (5)

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