Characterization of multilayers by means of EDXS in the analytical TEM

Fresenius' Journal of Analytical Chemistry

Volumn 361, Issue 6-7, 1998, Pages 633-636

  Thomas, Jürgen ^a   Rennekamp, Reinhold ^a   Van Loyen, Ludwig ^a  

^a IFW DRESDEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34548284545     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160050974     Document Type: Article

References (6)

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3. Capellen van E (1993) Proc Autumn School Anal Transm Electr Micr Mat Sci. Halle/Saale, Sept. 26th-Oct. 1st:65
4. Williams DB, Carter CB (1996) Transmission Electron Microscopy, part IV: Spectrometry. Plenum Press, New York
5. Thomas J (1997) Mikrochim Acta 125:307
6. Joy DC(1995) Monte Carlo Modeling for Electron Microscopy and Microanalysis. Oxford University Press, New York Oxford