|
|
Volumn 179, Issue 1-4, 2001, Pages 61-67
|
|
Analysis of nanoscale multilayers by EDXS and EELS in the STEM
|
|
Author keywords
Analytical TEM; EDXS; EELS; Nanoscale multilayers; STEM
|
|
Indexed keywords
COMPUTATIONAL METHODS;
ELECTRON ENERGY LOSS SPECTROSCOPY;
ENERGY DISPERSIVE SPECTROSCOPY;
MATHEMATICAL MODELS;
TRANSMISSION ELECTRON MICROSCOPY;
NANOSCALE MULTILAYERS;
MULTILAYERS;
|
|
EID: 0035898775
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(01)00264-1 Document Type: Article |
|
Times cited : (3)
|
|
References (6)
|
