Spectroscopic analysis of the interface chemistry of ultra-thin plasma polymer films on iron

Surface and Coatings Technology

Volumn 200, Issue 1-4 SPEC. ISS., 2005, Pages 100-103

  Wapner, K ^a   Grundmeier, G ^a  

^a MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

Author keywords

Fourier transform infrared spectroscopy; Iron; Radio frequency plasma; Secondary ion mass spectroscopy (ToF SIMS)

Indexed keywords

FOURIER TRANSFORM INFRARED SPECTROSCOPY; INTERFACES (MATERIALS); IRON; PLASMAS; SECONDARY ION MASS SPECTROMETRY; SILANES; SPECTROSCOPIC ANALYSIS; SURFACE CHEMISTRY; ULTRATHIN FILMS;

INTERFACE CHEMISTRY; PLASMA POLYMER FILMS; RADIOFREQUENCY PLASMA;

PROTECTIVE COATINGS;

CHEMISTRY;

EID: 24644477001     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2005.02.075     Document Type: Article

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