Atom-by-atom analysis of non-metallic materials by the scanning atom probe

Chinese Journal of Physics

Volumn 43, Issue 1 II, 2005, Pages 111-123

  Nishikwa, O ^a   Taniguchi, M ^a  

^a KANAZAWA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 24644474113     PISSN: 05779073     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review

References (19)

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