Atom Probe Field Ion Microscopy of High Resistivity Materials

Microscopy and Microanalysis

Volumn 4, Issue , 1998, Pages 90-91

  Miller, M K ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85180097577     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927600020572     Document Type: Article

References (3)

1. M. K. Miller et al., Atom Probe Field Ion Microscopy, Oxford, Oxford University Press (1996).
2. A. J. Melmed, et al., Appl. Phys. Lett. 39 (1981) 416"
3. This research was sponsored by the Division of Materials Sciences, U.S. Department of Energy, under contract DE-AC05-96OR22464 with Lockheed Martin Energy Research Corp. and by an appointment to the ORNL Postdoctoral Research Associates Program administered jointly by the Oak Ridge Institute for Science and Education and ORNL. This research was conducted utilizing the Shared Research Equipment (SHaRE) User Program facilities at ORNL.