Development of a scanning atom probe and atom-by-atom mass analysis of diamonds

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

  Nishikawa, O ^a   Sekine, T ^a   Ohtani, Y ^a   Maeda, K ^a   Numada, Y ^a   Watanabe, M ^a   Iwatsuki, M ^b   Aoki, S ^b   Itoh, J ^c   Yamanaka, K ^d  

^a KANAZAWA INSTITUTE OF TECHNOLOGY   (Japan)

^b JEOL LTD   (Japan)

^c ELECTROTECHNICAL LABORATORY   (Japan)

^d TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOM PROBE; CARBON ATOMS; DIAMOND STRUCTURES; FIELD EVAPORATION; HIGH ELECTRIC FIELDS; HIGH TEMPERATURE; LITHOGRAPHIC PROCESS; MASS ANALYSIS; MICROEXTRACTION; NEGATIVE BIAS; OPEN HOLES; SPACE BETWEEN; SPECIMEN SURFACES; ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPES; UNIQUE FEATURES;

ATOMS; CHEMICAL VAPOR DEPOSITION; DIAMONDS; ELECTRIC FIELDS; HYDROGEN BONDS; PLATINUM; PROBES; SCANNING; VACUUM;

CRYSTAL ATOMIC STRUCTURE;

EID: 0002652651     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051090     Document Type: Article

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