Kinetics of the thin films transformation Ti/Al multilayer→γ-TiAl

Surface and Coatings Technology

Volumn 200, Issue 1-4 SPEC. ISS., 2005, Pages 326-329

  Ramos, A Sofia ^a   Vieira, M T ^a  

^a UNIVERSITY OF COIMBRA   (Portugal)

Author keywords

Phase transitions; Sputtering; Thin films; Ti Al multilayers; Titanium aluminides

Indexed keywords

ACTIVATION ENERGY; ALUMINUM; CALCULATIONS; DIFFERENTIAL SCANNING CALORIMETRY; MAGNETRON SPUTTERING; MULTILAYERS; PHASE COMPOSITION; PHASE TRANSITIONS; REACTION KINETICS; TITANIUM; TITANIUM ALLOYS; X RAY DIFFRACTION ANALYSIS;

MULTILAYER THIN FILMS; NANOMETRIC BILAYER THICKNESS; REACTIVITY; TITANIUM ALUMINIDES;

THIN FILMS;

COATING;

EID: 24644471922     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2005.01.080     Document Type: Article

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