Microstructure evolution during annealing of an amorphous TiAl sheet

Materials Science and Engineering: A

Volumn 340, Issue 1-2, 2003, Pages 216-224

  Senkov, O N ^a,b   Uchic, M D ^a  

^a AIR FORCE RESEARCH LABORATORY   (United States)

^b UES INC   (United States)

Author keywords

Amorphous materials; Differential thermal analysis; Phase transformations; Physical vapor deposition; Titanium aluminide; X ray diffraction

Indexed keywords

ANNEALING; CRYSTALLIZATION; DECOMPOSITION; DIFFERENTIAL THERMAL ANALYSIS; GRAIN SIZE AND SHAPE; MICROSTRUCTURE; PHASE TRANSITIONS; PHYSICAL VAPOR DEPOSITION; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

AMORPHOUS PHASES;

MATERIALS SCIENCE;

ALUMINUM; ANNEALING; MICROSTRUCTURE; PHASE CHANGE; PHYSICAL VAPOR DEPOSITION; TITANIUM;

EID: 0037437535     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(02)00189-2     Document Type: Article

References (22)