Structural and phase transformations in thin film Ti-aluminides and Ti/Al multilayers

Materials Research Society Symposium - Proceedings

Volumn 434, Issue , 1996, Pages 63-68

  Banerjee, R ^a   Swaminathan, S ^a   Wheeler, R ^a   Fraser, H L ^a  

^a OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; AMORPHOUS FILMS; ANNEALING; CRYSTALLIZATION; MATHEMATICAL MODELS; MULTILAYERS; PHASE TRANSITIONS; SPUTTER DEPOSITION; STRUCTURE (COMPOSITION); THERMAL EFFECTS; TITANIUM; TRANSMISSION ELECTRON MICROSCOPY;

FACE CENTERED CUBIC STRUCTURE; HEXAGONAL CUBIC PHASE; REDFIELD-ZANGWILL MODEL; STRUCTURAL TRANSITIONS; TITANIUM ALUMINIDES;

THIN FILMS;

EID: 0030420652     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-434-63     Document Type: Conference Paper

References (10)