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Volumn 59, Issue 6, 2003, Pages 802-810

New electron diffraction method to identify the chirality of enantiomorphic crystals

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DIFFRACTION; ELECTRON SCATTERING; ISOMERS; TRANSMISSION ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY; X RAY POWDER DIFFRACTION;

EID: 2442651858     PISSN: 01087681     EISSN: None     Source Type: Journal    
DOI: 10.1107/S010876810302411X     Document Type: Article
Times cited : (25)

References (35)
  • 24
    • 0041484436 scopus 로고
    • edited by G. N. Ramachandran. London: Academic Press
    • Ramaseshan, S. (1964). Advanced Methods of Crystallography, edited by G. N. Ramachandran, pp. 67-95. London: Academic Press.
    • (1964) Advanced Methods of Crystallography , pp. 67-95
    • Ramaseshan, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.