Gradual facet degradation of (Al,In)GaN quantum well lasers

Applied Physics Letters

Volumn 84, Issue 16, 2004, Pages 2989-2991

  Kummler V ^a   Lell, A ^a   Harle V ^a   Schwarz, U T ^b   Schoedl, T ^b   Wegscheider, W ^b  

^a OSRAM OPTO SEMICONDUCTORS GMBH   (Germany)

^b UNIVERSITY OF REGENSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; CURRENT VOLTAGE CHARACTERISTICS; DEGRADATION; DIELECTRIC MATERIALS; EPITAXIAL GROWTH; GALLIUM NITRIDE; LIGHT ABSORPTION; LIGHT REFLECTION; OPTICAL DISK STORAGE; OXIDATION; PHOTONS; SEMICONDUCTOR LASERS;

DEFECT DENSITY; EPITAXIAL LATERAL OVERGROWTH (ELO); PHOTON DENSITY; SLOPE EFFICIENCY;

SEMICONDUCTOR QUANTUM WELLS;

EID: 2442570665     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1704861     Document Type: Article

References (13)

1. M. Ikseda and S. Uchida, Phys. Status Solidi A 194, 407 (2002).
2. T. Mukai, S. Nagahama, T. Yanamoto, and M. Sano, Phys. Status Solidi A 194, 261 (2002).
3. S. Bader, B. Hahn, H.-J. Lugauer, A. Lell, A. Weimar, G. Brüderl, J. Baur, D. Eisert, M. Scheubeck, S. Heppel, A. Hangleiter, and V. Härle, Phys. Status Solidi A 180, 177 (2000).
4. V. Kümmler, G. Brüderl, S. Bader, S. Miller, A. Weimar, A. Lell, V. Härle, U. T. Schwarz, N. Gmeinwieser, and W. Wegscheider, Phys. Status Solidi A 194, 419 (2002).
5. M. Fukuda, Reliability and Degradation of Semiconductor Lasers and LEDs (Artech House, Norwood, 1991).
6. K. Itaya, M. Ishikawa, H. Okuda, Y. Watanabe, and K. Nitta, Appl. Phys. Lett. 53, 1363 (1988).
7. I. Ladany, M. Ettenberg, H. F. Lockwood, and H. Kressel, Appl. Phys. Lett. 30, 87 (1977).
8. J. Schalwig, G. Müller, I. Karrer, M. Eickhoff, O. Ambacher, M. Stutzmann, L. Görgens, and G. Dollinger, Appl. Phys. Lett. 80, 1222 (2002).
9. G. Steinhoff, M. Hermann, W. J. Schaff, L. F. Eastman, M. Stutzmann, and M. Eickhoff, Appl. Phys. Lett. 83, 177 (2003).
10. C. H. Henry, P. M. Petroff, R. A. Logan, and F. R. Merritt, J. Appl. Phys. 50, 3721 (1979).
11. M. Fukuda and K. Takahei, J. Appl. Phys. 57, 129 (1985).
12. M. Okayasu, M. Fukuda, T. Tatsuya, S. Uehara, and K. Kurumada, J. Appl. Phys. 69, 8346 (1991).
13. M. Fukuda, M. Okayasu, T. Takeshita, and M. Wada, Quality and Reliability Eng. Int. 8, 238 (1992).