Formalized three-layer system-level reuse model and methodology for embedded data-dominated applications

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2000, Pages 92-98

  Vermeulen, F ^b   Catthoor, F ^b   Verkest, D ^a   De Man, H ^b  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

AREA SAVINGS; DATA ACCESS; DESIGN EXPLORATION; EXPLORATION PHASE; FIXED BLOCK; REUSE MODEL; SYSTEM LEVELS; THREE-LAYER;

DATA TRANSFER; DIGITAL STORAGE; EXHIBITIONS;

DESIGN;

EID: 2442529659     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2000.840022     Document Type: Conference Paper

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