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Volumn 27, Issue 1, 2004, Pages 117-123

Synthesis of thermal RC-networks for systems-in-packages

Author keywords

Compact model; Multichip module (MCM); System in package (SiP); Thermal characterization; Thermal modeling

Indexed keywords

COMPUTER SIMULATION; FINITE ELEMENT METHOD; INTEGRATED CIRCUIT LAYOUT; MATHEMATICAL MODELS; MULTICHIP MODULES; OPTIMIZATION; TEMPERATURE;

EID: 2442505466     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAPT.2004.825773     Document Type: Article
Times cited : (5)

References (13)
  • 1
    • 0031381701 scopus 로고    scopus 로고
    • The world of thermal characterization according to DELPHI-part 1: Background to DELPHI
    • Dec.
    • H. Rosten, C. Lasance, and J. Parry, "The world of thermal characterization according to DELPHI-part 1: background to DELPHI," IEEE Trans. Comp., Packag., Manufact. Technol. A, vol. 20, pp. 384-391, Dec. 1997.
    • (1997) IEEE Trans. Comp., Packag., Manufact. Technol. A , vol.20 , pp. 384-391
    • Rosten, H.1    Lasance, C.2    Parry, J.3
  • 3
    • 2442522086 scopus 로고    scopus 로고
    • Tech. Rep.
    • Philips. (2003). Tech. Rep. [Online]. Available: http://www.extra.research.philips.com/euprojects/profit
    • (2003)
  • 4
    • 0343480570 scopus 로고    scopus 로고
    • Thermal characterization of electronic devices by means of improved boundary condition independent compact models
    • H. Vinke and C. Lasance, "Thermal characterization of electronic devices by means of improved boundary condition independent compact models," in Proc. EUROTHERM Seminar 45, Leuven, Belgium, Sept. 1995.
    • Proc. EUROTHERM Seminar 45, Leuven, Belgium, Sept. 1995
    • Vinke, H.1    Lasance, C.2
  • 7
  • 11
    • 2442626337 scopus 로고    scopus 로고
    • Creating reduced-order models for electronic systems: An overview and suggested use of existing model reduction and experimental system identification tools
    • B. Shapiro, "Creating reduced-order models for electronic systems: an overview and suggested use of existing model reduction and experimental system identification tools," in Proc. THERMES Workshop, Santa Fe, NM, Jan. 13-16, 2002.
    • Proc. THERMES Workshop, Santa Fe, NM, Jan. 13-16, 2002
    • Shapiro, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.