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Volumn 795, Issue , 2003, Pages 81-86
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Fracture patterns in thin films and multilayers
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Author keywords
[No Author keywords available]
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Indexed keywords
BUCKLING;
DELAMINATION;
FRACTURE;
MORPHOLOGY;
MULTILAYERS;
RESIDUAL STRESSES;
STRESS RELIEF;
TENSILE STRESS;
DUNDURS PARAMETERS;
STONEY'S EQUATION;
STRAIN ENERGY;
SUBSTRATE BENDING;
THIN FILMS;
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EID: 2442482696
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-795-u3.8 Document Type: Conference Paper |
Times cited : (7)
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References (28)
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