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Volumn 795, Issue , 2003, Pages 81-86

Fracture patterns in thin films and multilayers

Author keywords

[No Author keywords available]

Indexed keywords

BUCKLING; DELAMINATION; FRACTURE; MORPHOLOGY; MULTILAYERS; RESIDUAL STRESSES; STRESS RELIEF; TENSILE STRESS;

EID: 2442482696     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-795-u3.8     Document Type: Conference Paper
Times cited : (7)

References (28)
  • 26
    • 2442532320 scopus 로고    scopus 로고
    • http://www.eng.usf.edu/~volinsky
  • 28
    • 2442584972 scopus 로고    scopus 로고
    • A.A. Volinsky, et. al., to be published
    • A.A. Volinsky, et. al., to be published


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.