Ion channeling and Raman scattering studies of the lattice disorder and residual strain in neutron irradiated GaN

Solid State Communications

Volumn 131, Issue 1, 2004, Pages 31-35

  Kuriyama, K ^a   Tokumasu, T ^a   Sano, H ^a   Okada, M ^b  

^a HOSEI UNIVERSITY   (Japan)

^b KYOTO UNIVERSITY   (Japan)

Author keywords

A. GaN; C. Complex defects; E. Ion channeling; E. Raman scattering; E. Strain

Indexed keywords

ANNEALING; BACKSCATTERING; CRYSTAL LATTICES; CRYSTALS; ISOTOPES; LATTICE CONSTANTS; METALLORGANIC VAPOR PHASE EPITAXY; NEUTRON IRRADIATION; RAMAN SCATTERING; STRAIN; STRESS ANALYSIS; X RAY DIFFRACTION ANALYSIS;

BIAXIAL STRESS; COMPLEX DEFECTS; ION CHANNELING;

GALLIUM NITRIDE;

EID: 2442459646     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2004.04.020     Document Type: Article

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