메뉴 건너뛰기




Volumn 45, Issue 3, 2004, Pages 714-720

Effect of Cu addition to Sn-Ag lead-free solder on interfacial stability with Fe-42Ni

Author keywords

Copper; Iron 42 nichkel; Lead free solder; Nichkel; Reaction interface; Silver; Tin; Tin silver copper solder

Indexed keywords

COPPER ALLOYS; CRACK PROPAGATION; ELECTRONICS PACKAGING; EUTECTICS; INTERFACES (MATERIALS); INTERMETALLICS; MICROSTRUCTURE; NICKEL ALLOYS; SCANNING ELECTRON MICROSCOPY; SILVER ALLOYS; SOLDERED JOINTS; SOLDERING; SOLIDIFICATION; TIN ALLOYS;

EID: 2442432528     PISSN: 13459678     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans.45.714     Document Type: Article
Times cited : (16)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.