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Volumn 45, Issue 3, 2004, Pages 714-720
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Effect of Cu addition to Sn-Ag lead-free solder on interfacial stability with Fe-42Ni
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Author keywords
Copper; Iron 42 nichkel; Lead free solder; Nichkel; Reaction interface; Silver; Tin; Tin silver copper solder
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Indexed keywords
COPPER ALLOYS;
CRACK PROPAGATION;
ELECTRONICS PACKAGING;
EUTECTICS;
INTERFACES (MATERIALS);
INTERMETALLICS;
MICROSTRUCTURE;
NICKEL ALLOYS;
SCANNING ELECTRON MICROSCOPY;
SILVER ALLOYS;
SOLDERED JOINTS;
SOLDERING;
SOLIDIFICATION;
TIN ALLOYS;
IRON-42 NICKEL;
LEAD-FREE SOLDERS;
REACTION INTERFACE;
TIN-SILVER-COPPER;
SOLDERING ALLOYS;
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EID: 2442432528
PISSN: 13459678
EISSN: None
Source Type: Journal
DOI: 10.2320/matertrans.45.714 Document Type: Article |
Times cited : (16)
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References (23)
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