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Volumn 43, Issue 3, 2004, Pages 1051-1054
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Electrical properties of melt-epitaxy-grown InAs0.04Sb 0.96 layers with cutoff wavelength of 12 μm
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Author keywords
Electron mobility; InAsSb; Melt epitaxy; Perfection; Purity; Scattering
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Indexed keywords
CARRIER CONCENTRATION;
CONTAMINATION;
ELECTRON MOBILITY;
EPITAXIAL GROWTH;
FUNCTIONS;
FUSED SILICA;
HIGH TEMPERATURE EFFECTS;
LIGHT SCATTERING;
SAMPLING;
INASSB;
MELT EPITAXY;
PERFECTION;
PURITY;
INDIUM COMPOUNDS;
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EID: 2442424456
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/JJAP.43.1051 Document Type: Article |
Times cited : (27)
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References (12)
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