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Volumn 43, Issue 3, 2004, Pages 1051-1054

Electrical properties of melt-epitaxy-grown InAs0.04Sb 0.96 layers with cutoff wavelength of 12 μm

Author keywords

Electron mobility; InAsSb; Melt epitaxy; Perfection; Purity; Scattering

Indexed keywords

CARRIER CONCENTRATION; CONTAMINATION; ELECTRON MOBILITY; EPITAXIAL GROWTH; FUNCTIONS; FUSED SILICA; HIGH TEMPERATURE EFFECTS; LIGHT SCATTERING; SAMPLING;

EID: 2442424456     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.1051     Document Type: Article
Times cited : (27)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.