A versatile Nyquist-rate A/D converter with 16-18 bit performance for sensor readout applications

Integration, the VLSI Journal

Volumn 39, Issue 1, 2005, Pages 48-61

  Rombouts, Pieter ^a   Weyten, Ludo ^a  

^a GHENT UNIVERSITY   (Belgium)

Author keywords

Analog to digital conversion; Switched capacitor circuits

Indexed keywords

APPROXIMATION THEORY; CAPACITORS; CMOS INTEGRATED CIRCUITS; ELECTRIC POTENTIAL; ELECTRIC POWER UTILIZATION; NYQUIST DIAGRAMS; READOUT SYSTEMS;

EXTENDING COUNTING TECHNIQUES; NONLINEARITY CORRECTION; RECONSTRUCTION LOGIC; SWITCHED-CAPACITOR CIRCUITS;

ANALOG TO DIGITAL CONVERSION;

EID: 24344479181     PISSN: 01679260     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vlsi.2004.12.002     Document Type: Article

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