Robust, versatile, direct low-frequency noise characterization method for material/process quality control using cross-shaped 4-terminal devices

Microelectronics Reliability

Volumn 45, Issue 9-11, 2005, Pages 1327-1330

  Kerlain, A ^a   Mosser, V ^a  

^a Itron France   (France)

Author keywords

[No Author keywords available]

Indexed keywords

LOW-FREQUENCY (LF) NOISE; QUALITY ANALYSIS; RELIABILITY MONITORING;

ALUMINUM COMPOUNDS; GERMANIUM COMPOUNDS; HETEROJUNCTIONS; QUALITY CONTROL; SPURIOUS SIGNAL NOISE;

RELIABILITY;

EID: 24144496870     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2005.07.015     Document Type: Conference Paper

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