Low energy electron microscopy investigations of kinetics and energetics on clean close-packed metal surfaces

Journal of Physics Condensed Matter

Volumn 17, Issue 16, 2005, Pages

  Ondrejcek, M ^a   Rajappan, M ^a   Swiech, W ^a   Flynn, C P ^a  

^a United States of America   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; ION BEAMS; PERTURBATION TECHNIQUES; SPECTROSCOPIC ANALYSIS; SURFACE PROPERTIES;

LOW ENERGY ELECTRON MICROSCOPY; METAL SURFACES; STEP FLUCTUATION SPECTROSCOPY; SURFACE PROCESSES;

ELECTRON MICROSCOPY;

EID: 24144455666     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/17/16/010     Document Type: Article

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