A cascade open-short-thru (COST) de-embedding method for microwave on-wafer characterization and automatic measurement

IEICE Transactions on Electronics

Volumn E88-C, Issue 5, 2005, Pages 845-849

  Cho, Ming Hsiang ^a   Huang, Guo Wei ^a   Chiu, Chia Sung ^a   Chen, Kun Ming ^a   Peng, An Sam ^a   Teng, Yu Min ^a  

^a NATIONAL NANO DEVICE LABORATORIES   (Taiwan)

Author keywords

Automatic measurement; Cascade configuration; On wafer deembedding; S parameters; Silicon

Indexed keywords

AUTOMATION; EMBEDDED SYSTEMS; NATURAL FREQUENCIES; SCATTERING PARAMETERS; SILICON; SILICON WAFERS;

AUTOMATIC MEASUREMENT; CASCADE CONFIGURATION; ON-WAFER DEEMBEDDING; RADIO FREQUENCY;

MICROWAVES;

EID: 24144444739     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: 10.1093/ietele/e88-c.5.845     Document Type: Conference Paper

References (10)

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