Nanoscale in-plane displacement evaluation by AFM scanning and digital image correlation processing

Nanotechnology

Volumn 16, Issue 4, 2005, Pages 344-349

  Chang, S ^a   Wang, C S ^a   Xiong, C Y ^a   Fang, J ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ATOMIC FORCE MICROSCOPY; CORRELATION THEORY; DEFORMATION; ELECTROMECHANICAL DEVICES; ELECTROSTATICS; MICROSTRUCTURE; SCANNING; SURFACE TOPOGRAPHY;

DIGITAL IMAGE CORRELATION (DIC); ELECTROSTATIC ACTUATION; IN-PLANE DISPLACEMENT EVALUATION; SCAN SURFACE TOPOGRAPHIES;

IMAGE PROCESSING;

EID: 24144435293     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/16/4/002     Document Type: Article

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