Direct imaging of the end-of-range and surface profiles of proton-beam written erbium-doped waveguide amplifiers by atomic force microscopy

Journal of Applied Physics

Volumn 98, Issue 3, 2005, Pages

  Sum, T C ^a   Bettiol, A A ^b   Van Kan, J A ^b   Venugopal Rao, S ^b   Watt, F ^b   Liu, K ^c   Pun, E Y B ^c  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^c CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

PHOSPHATE GLASS; PROTON-BEAM WRITING; SINGLE-MODE WAVEGUIDES; WAVEGUIDE AMPLIFIERS;

ATOMIC FORCE MICROSCOPY; DOPING (ADDITIVES); ERBIUM; METALLIC GLASS; PHOSPHATES; REFRACTIVE INDEX; WAVEGUIDES;

AMPLIFIERS (ELECTRONIC);

EID: 23944484507     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2001748     Document Type: Article

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