Direct imaging of end-of-range compaction in ion beam irradiated silica waveguides by atomic force microscopy

Journal of Applied Physics

Volumn 87, Issue 12, 2000, Pages 8429-8432

  Von Bibra, M L ^a   Roberts, A ^a   Mulvaney, P ^a   Huntington, S T ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038267809     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373558     Document Type: Article

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