Crystal orientation mapping applied to the Y-TZP/WC composite

Microchimica Acta

Volumn 139, Issue 1-4, 2002, Pages 55-59

  Faryna, Marek ^a,b   Bischoff, Ewald ^c   Sztwiertnia, Krzysztof ^b  

^a JAGIELLONIAN UNIVERSITY   (Poland)

^b INSTITUTE OF METALLURGY AND MATERIALS SCIENCE   (Poland)

^c MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Automatic crystal orientation mapping (ACOM); Electron backscattered diffraction (EBSD); Orientation imaging microscopy (OIM ); Y TZP based composite

Indexed keywords

EID: 23944473520     PISSN: 00263672     EISSN: 14365073     Source Type: Journal    
DOI: 10.1007/s006040200039     Document Type: Article

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