|
Volumn 35, Issue 1, 1998, Pages 4-20
|
Experiences on contrasting microstructure using orientation imaging microscopy;Erfahrungen zur gefüge-kontrastierung mit der orientierungs-abbildenden rasterelektronenmikroskopie
a a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
BACKSCATTERING;
CERAMIC MATERIALS;
CRYSTAL ORIENTATION;
ELECTRON DIFFRACTION;
ELECTRON SCATTERING;
ELECTRONS;
GRAIN BOUNDARIES;
SCANNING ELECTRON MICROSCOPY;
A-PLANE;
BACKSCATTERED ELECTRONS;
ELECTRON-BEAM;
GRAIN-BOUNDARIES;
INTENSITY DISTRIBUTION;
KIKUCHI PATTERNS;
ORIENTATION IMAGING MICROSCOPY;
POLISHED SURFACES;
SAMPLE SURFACE;
SCANNING ELECTRONS;
CRYSTAL LATTICES;
|
EID: 0002776914
PISSN: 0032678X
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (10)
|
References (9)
|