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Volumn 35, Issue 1, 1998, Pages 4-20

Experiences on contrasting microstructure using orientation imaging microscopy;Erfahrungen zur gefüge-kontrastierung mit der orientierungs-abbildenden rasterelektronenmikroskopie

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; CERAMIC MATERIALS; CRYSTAL ORIENTATION; ELECTRON DIFFRACTION; ELECTRON SCATTERING; ELECTRONS; GRAIN BOUNDARIES; SCANNING ELECTRON MICROSCOPY;

EID: 0002776914     PISSN: 0032678X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (10)

References (9)
  • 6
    • 0001770453 scopus 로고
    • The Determination of Local Texture by Electron Diffraction - A Tutorual Review
    • Schwarzer, R. A., The Determination of Local Texture by Electron Diffraction - A Tutorual Review, Tex. Micros. 20 (1993) 7
    • (1993) Tex. Micros. , vol.20 , pp. 7
    • Schwarzer, R.A.1
  • 7
    • 0027656570 scopus 로고
    • A Review of Automated Orientation Imaging Microscopy (OIM)
    • Wright, S. I., A Review of Automated Orientation Imaging Microscopy (OIM), J. Comp. Assisted Microscopy 5 (1993) 207
    • (1993) J. Comp. Assisted Microscopy , vol.5 , pp. 207
    • Wright, S.I.1
  • 8
    • 0003705480 scopus 로고
    • Deutscher Verlag für Grundstoffindustrie, Leipzig
    • Schumann, H., Metallographie, Deutscher Verlag für Grundstoffindustrie, Leipzig (1991)
    • (1991) Metallographie
    • Schumann, H.1
  • 9
    • 0342301943 scopus 로고
    • An Automatic Online Technique for Determination of Crystallographic Orientations by EBSP
    • Wollongong, Australia; ed. Chandra, T. (Min. Met. Mater. Soc. USA)
    • Juul Jensen, D.; Schmidt. H.: An Automatic Online Technique for Determination of Crystallographic Orientations by EBSP, in Proc. Recrystallisation '90, Wollongong, Australia; ed. Chandra, T. (Min. Met. Mater. Soc. USA) (1990) 219
    • (1990) Proc. Recrystallisation '90 , pp. 219
    • Juul Jensen, D.1    Schmidt, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.