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Volumn 44, Issue 6 A, 2005, Pages 3757-3759

An in-situ fabrication and characterization system developed for high performance organic semiconductor devices

Author keywords

C60; Field effect transistor; In situ; Mobility, top contact; N type; Organic semiconductor

Indexed keywords

CARBON; CHARACTERIZATION; FIELD EFFECT TRANSISTORS; SEMICONDUCTOR DEVICE MANUFACTURE; VACUUM;

IN-SITU; MOBILITY TOP CONTACT; N-TYPE;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 23944436857 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/JJAP.44.3757 Document Type: Article

Times cited : (12)

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