In situ quantitative plasmon spectroscopic determination and imaging of multiple solid-state properties at the nanoscale: A new capability for material research

Materials Research Society Symposium Proceedings

Volumn 839, Issue , 2005, Pages 29-34

  Oleshko, Vladimir P ^a   Howe, James M ^a  

^a University of Virginia   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; CARRIER CONCENTRATION; ELECTRIC INSULATORS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONS; HARDNESS; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; PERMITTIVITY; RESONANCE; SPECTROSCOPIC ANALYSIS;

COHESIVE ENERGY; COVALENT BONDING; UNIVERSAL BINDING ENERGY RELATION (UBER); VALENCE ELECTRON ENERGY-LOSS SPECTROSCOPY (VEELS);

MATERIALS SCIENCE;

EID: 23844552444     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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