Inelastic X-Ray scattering study of the metal-antiferromagnetic insulator transition in V2O3

Physical Review Letters

Volumn 76, Issue 22, 1996, Pages 4211-4214

  Isaacs, E D ^a   Platzman, P M ^a   Metcalf, P ^b   Honig, J M ^b  

^a LUCENT TECHNOLOGIES   (United States)

^b PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CORRELATION METHODS; CRYSTAL STRUCTURE; ELECTRON ENERGY LEVELS; ELECTRON SPECTROSCOPY; ENERGY DISSIPATION; POLARIZATION; VANADIUM COMPOUNDS; X RAY ANALYSIS;

ELECTRONIC EXCITATION; INELASTIC X RAY SCATTERING; METAL ANTIFERROMAGNETIC INSULATOR TRANSITION; MOTT HUBBARD TRANSITION; PLASMON; VANADIA;

PHASE TRANSITIONS;

EID: 8544282464     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.76.4211     Document Type: Article

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