Analysis of lead oxide (PbO) layers for direct conversion X-ray detection

IEEE Nuclear Science Symposium Conference Record

Volumn 7, Issue , 2004, Pages 4268-4272

  Simon, M ^a   Ford, R A ^c   Franklin, A R ^c   Grabowski, S P ^a   Menser, B ^a   Much, G ^a   Nascetti, A ^a,b   Overdick, M ^a   Powell, M J ^c   Wiechert, D U ^a  

^a PHILIPS RESEARCH LABORATORIES   (Germany)

^b SAPIENZA UNIVERSITY OF ROME   (Italy)

^c PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; ELECTRIC CHARGE; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; IMAGE ANALYSIS; MEDICAL APPLICATIONS; PHOSPHORS; RADIATION DETECTORS; THIN FILM TRANSISTORS; X RAYS;

LEAD OXIDE (PBO); VACUUM CHAMBER; X-RAY IMAGE; X-RAY IMAGING;

LEAD COMPOUNDS;

EID: 23844528059     PISSN: 10957863     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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