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1
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0032401548
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Dynamic X-ray imaging system based on an amorphous silicon thin-film array
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N. Jung, P.L. Alving, F. Busse, N. Conrads, H.M. Meulenbrugge, W. Rütten, U. Schiebel, M. Weibrecht, H. Wieczorek, "Dynamic X-ray Imaging System based on an Amorphous Silicon Thin-Film Array", Proc. SPIE Vol. 3336, pp. 396-407, 1998.
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Jung, N.1
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Meulenbrugge, H.M.5
Rütten, W.6
Schiebel, U.7
Weibrecht, M.8
Wieczorek, H.9
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2
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0033740083
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Optimization of key building blocks for a large area radiographic and fluoroscopic dynamic digital X-ray detector based on a-Si:H/CsI:Tl flat panel technology
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T. Ducourant, M. Michel, G. Vieux, T. Peppler, J.C. Trochet, R.F. Schulz, R.J.M. Bastiaens, F. Busse, "Optimization of Key Building Blocks for a Large Area Radiographic and Fluoroscopic Dynamic Digital X-Ray Detector Based on a-Si:H/CsI:Tl Flat Panel Technology", Proc. SPIE Vol. 3977, pp. 14-25, 2000.
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Proc. SPIE
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Ducourant, T.1
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Schulz, R.F.6
Bastiaens, R.J.M.7
Busse, F.8
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3
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0034872944
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Performance of a flat panel cardiac detector
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P.R. Granfors, D. Albagli, J.E. Tkaczyk, R. Aufrichtig, H. Netel, G. Brunst, J. Boudry, D. Luo, "Performance of a Flat Panel Cardiac Detector", Proc. SPIE Vol. 4320, pp. 77-86, 2001.
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Granfors, P.R.1
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Brunst, G.6
Boudry, J.7
Luo, D.8
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4
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0032401630
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Development of a selenium-based flat-panel detector for real-time radiography and fluoroscopy
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A. Tsukamoto, S. Yamada, T. Tomisaki, M. Tanaka, T. Sakaguchi, H. Asahina, M. Nishiki, "Development of a selenium-based flat-panel detector for real-time radiography and fluoroscopy", Proc. SPIE Vol. 3336, pp. 388-395, 1998.
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Tsukamoto, A.1
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Asahina, H.6
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5
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0034867204
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Performance of a real-time selenium-based X-ray detector for fluoroscopy
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M. Choquette, Y. Demers, Z. Shukri, O. Tousignant, K. Aoki, M. Honda, A. Takahashi, A. Tsukamoto, "Performance of a real-time selenium-based X-ray detector for fluoroscopy", Proc. SPIE Vol. 4320, pp. 501-508, 2001.
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Takahashi, A.7
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6
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0034870333
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Temporal artifacts in flat dynamic X-ray detectors
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M. Overdick, T. Solf, H.-A. Wischmann, "Temporal Artifacts in Flat Dynamic X-ray Detectors", Proc. SPIE Vol. 4320, pp. 47-58, 2001.
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Overdick, M.1
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Wischmann, H.-A.3
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7
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0011773692
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Comparative study of PbI2 and HgJ2 as direct detector materials for high-resolution x-ray image sensors
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R.A. Street, M. Mulato, M.M. Schieber, H. Hermon, K.S. Shah, P.R. Bennett, Y. Dmitryev, J. Ho, R. Lau, E. Meerson, S.E. Ready, B. Reisman, Y. Sado, K. van Schuylenbergh, A.I. Vilensky, A. Zuck, "Comparative study of PbI2 and HgJ2 as direct detector materials for high-resolution x-ray image sensors", Proc. SPIE Vol. 4320, pp. 1-12, 2001.
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Street, R.A.1
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Meerson, E.10
Ready, S.E.11
Reisman, B.12
Sado, Y.13
Van Schuylenbergh, K.14
Vilensky, A.I.15
Zuck, A.16
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9
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0034860237
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Electronic noise analysis of a 127-micron pixel TFT/photodiode array
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R.L. Weisfield, N.R. Bennett, "Electronic noise analysis of a 127-micron pixel TFT/photodiode array", Proc. SPIE Vol. 4320, pp. 209-218, 2001.
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Weisfield, R.L.1
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10
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0036034751
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Correction of amplifier non-linearity, offset, gain, temporal artifacts, and defects for flat panel digital imaging devices
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H.-A. Wischmann, H. Luijendijk, H. Meulenbrugge, M. Overdick, R. Schmidt, K. Kiani, "Correction of Amplifier Non-Linearity, Offset, Gain, Temporal Artifacts, and Defects for Flat Panel Digital Imaging Devices", to be published in Proc. SPIE Vol. 4682, 2002.
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Proc. SPIE
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Wischmann, H.-A.1
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Schmidt, R.5
Kiani, K.6
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11
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0034874454
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Methodology to measure fundamental performance parameters of X-ray detectors
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F. Busse, W. Rütten, H.-A. Wischmann, B. Geiger, M. Spahn, R.J.M. Bastiaens, T. Ducourant, "Methodology to Measure Fundamental Performance Parameters of X-Ray Detectors", Proc. SPIE Vol. 4320, pp. 287-298, 2001.
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Busse, F.1
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Ducourant, T.7
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