Methodology to measure fundamental performance parameters of x-ray detectors

Proceedings of SPIE- The International Society for Optical Engineering

Volumn 4320, Issue , 2001, Pages 287-298

  Busse, F ^a   Ru�tten, W ^a   Wischmann, H A ^a   Geiger, B ^a   Spahn, M ^a   Bastiaens, R J M ^a   Ducourant, T ^a  

^a PHILIPS RESEARCH LABORATORIES   (Germany)

Author keywords

Detective quantum efficiency; Electronic noise; Low frequency drop; Noise power spectrum; X ray detector

Indexed keywords

DETECTORS; IMAGE QUALITY; OPTICAL TRANSFER FUNCTION; QUANTUM EFFICIENCY; SIGNAL TO NOISE RATIO; SPECTRUM ANALYSIS; X RAY APPARATUS;

FLAT PANEL DETECTORS; NOISE POWER SPECTRUM; STATIC DETECTORS; X RAY DETECTORS;

MEDICAL IMAGING;

EID: 0034874454     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.430859     Document Type: Article

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