Coulomb blockade of the conductivity of SiOx films due to one-electron charging of a silicon quantum dot in a chain of electronic states

Semiconductors

Volumn 39, Issue 8, 2005, Pages 910-916

  Efremov, M D ^a   Kamaev, G N ^a   Volodin, V A ^a   Arzhannikova, S A ^a   Kachurin, G A ^a   Cherkova, S G ^a   Kretinin, A V ^a   Malyutina Bronskaya, V V ^a   Marin, D V ^a  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

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[No Author keywords available]

Indexed keywords

EID: 23844508133     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.2010684     Document Type: Conference Paper

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