-
1
-
-
66449107834
-
Single event upset susceptibility testing of the xilinx virtex-II FPGA
-
C. Yui, G. Swift, and C. Carmichael, "Single Event Upset Susceptibility Testing of the Xilinx Virtex-II FPGA," 2002 MAPLD, IV, 2002.
-
(2002)
2002 MAPLD
, vol.4
-
-
Yui, C.1
Swift, G.2
Carmichael, C.3
-
3
-
-
0019679302
-
Proton-induced nuclear reactions in silicon
-
P.J. McNulty, et al., "Proton-induced Nuclear Reactions in Silicon," IEEE Trans. Nucl. Sci., 28, 4007-4012, 1981.
-
(1981)
IEEE Trans. Nucl. Sci.
, vol.28
, pp. 4007-4012
-
-
McNulty, P.J.1
-
4
-
-
0022921352
-
Comparison of soft errors induced by heavy ions and protons
-
J.M. Bisgrove, et al., "Comparison of Soft Errors Induced by Heavy Ions and Protons," IEEE Trans. Nucl. Sci., 33, 1571-1576, 1986.
-
(1986)
IEEE Trans. Nucl. Sci.
, vol.33
, pp. 1571-1576
-
-
Bisgrove, J.M.1
-
5
-
-
0024171214
-
SEU test techniques for 256K SRAMs and comparison of upsets induced by heavy ions and protons
-
R. Koga, et al., "SEU Test Techniques for 256K SRAMs and Comparison of Upsets Induced by Heavy Ions and Protons," IEEE Trans. Nucl. Sci., 35, 1638-1643, 1988.
-
(1988)
IEEE Trans. Nucl. Sci.
, vol.35
, pp. 1638-1643
-
-
Koga, R.1
-
6
-
-
0024887312
-
A model for proton-induced SEU
-
T. Bion and J. Bourrieau, "A Model for Proton-induced SEU," IEEE Trans. Nucl. Sci., 36, 2281-2286, 1989.
-
(1989)
IEEE Trans. Nucl. Sci.
, vol.36
, pp. 2281-2286
-
-
Bion, T.1
Bourrieau, J.2
-
7
-
-
0032216861
-
Internuclear cascade-evaporation model for LET spectra of 200 MeV protons
-
P.M. O'Neill, et al., "Internuclear Cascade-evaporation Model for LET Spectra of 200 MeV Protons," IEEE Trans. Nucl. Sci., 45, 2467-2474, 1998.
-
(1998)
IEEE Trans. Nucl. Sci.
, vol.45
, pp. 2467-2474
-
-
O'Neill, P.M.1
-
8
-
-
0028447526
-
Characterization of proton interactions in electronic components
-
B. Doucin et al., "Characterization of Proton Interactions in Electronic Components," IEEE Trans. Nucl. Sci., 41, 593-600, 1994.
-
(1994)
IEEE Trans. Nucl. Sci.
, vol.41
, pp. 593-600
-
-
Doucin, B.1
-
9
-
-
0029462806
-
A simple model for calculating proton induced SEU
-
J. Barak, et al., "A Simple Model for Calculating Proton Induced SEU," RADECS95, 431-436, 1995.
-
(1995)
RADECS95
, pp. 431-436
-
-
Barak, J.1
-
11
-
-
0031338738
-
Proton upset rate simulation by a Monte Carlo method
-
C. Inguimbert, et al., "Proton Upset Rate Simulation by a Monte Carlo Method," IEEE Trans. Nucl. Sci., 44, 2243-2249, 1997
-
(1997)
IEEE Trans. Nucl. Sci.
, vol.44
, pp. 2243-2249
-
-
Inguimbert, C.1
-
12
-
-
0030361817
-
An empirical model for predicting proton induced upset
-
P. Calvel, et al., "An Empirical Model for Predicting Proton Induced Upset,: IEEE Trans. Nucl. Sci., 43, 2827-2832, 1996.
-
(1996)
IEEE Trans. Nucl. Sci.
, vol.43
, pp. 2827-2832
-
-
Calvel, P.1
-
13
-
-
33749382730
-
The relationship of proton and heavy ion upset thresholds
-
E.L. Petersen, "The Relationship of Proton and Heavy Ion Upset Thresholds," IEEE Trans. Nucl. Sci., 39, 1600-1604, 1992.
-
(1992)
IEEE Trans. Nucl. Sci.
, vol.39
, pp. 1600-1604
-
-
Petersen, E.L.1
-
16
-
-
0034290514
-
Proton SEU cross sections derived from heavy-ion test data
-
L.D. Edmonds, "Proton SEU Cross Sections Derived from Heavy-ion Test Data," IEEE Trans. Nucl. Sci., 47, 1713-1728, 2000.
-
(2000)
IEEE Trans. Nucl. Sci.
, vol.47
, pp. 1713-1728
-
-
Edmonds, L.D.1
-
17
-
-
0030374183
-
SEU cross sections derived from a diffusion analysis
-
Dec.
-
L.D. Edmonds, "SEU Cross Sections Derived from a Diffusion Analysis," IEE Trans. Nucl. Sci., 43, 3207-3217, Dec. 1996.
-
(1996)
IEE Trans. Nucl. Sci.
, vol.43
, pp. 3207-3217
-
-
Edmonds, L.D.1
-
18
-
-
8344249320
-
Empirical modeling of proton induced SEU rates
-
J. Barak, "Empirical Modeling of Proton Induced SEU Rates," RADECS99, 167-172, 2000.
-
(2000)
RADECS99
, pp. 167-172
-
-
Barak, J.1
-
19
-
-
0003651093
-
-
Xilinx, "Virtex-II Platform Handbook," ©2001. http://www.xilinx.com/products/virtex/handbook/index.htm
-
(2001)
Virtex-II Platform Handbook
-
-
-
20
-
-
0002990769
-
SEFI sensitivity in microcircuits
-
R. Koga, et al., "SEFI Sensitivity in Microcircuits," RADECS97, 311-318, 1997.
-
(1997)
RADECS97
, pp. 311-318
-
-
Koga, R.1
-
22
-
-
1242332765
-
Charge collection by capacitate influence through isolation oxides
-
V. Ferlet-Cavois, et al., "Charge Collection by Capacitate Influence through Isolation Oxides," IEEE Trans Nucl Sci., 50, 2003.
-
(2003)
IEEE Trans Nucl Sci.
, vol.50
-
-
Ferlet-Cavois, V.1
-
23
-
-
0036957460
-
Comparison of heavy ion and proton induced single event effects (SEE) sensitivities
-
R.Koga, etal., "Comparison of Heavy Ion and Proton Induced Single Event Effects (SEE) Sensitivities," IEEE Trans Nucl Sci., 49, 3135-3141, 2002.
-
(2002)
IEEE Trans Nucl Sci.
, vol.49
, pp. 3135-3141
-
-
Koga, R.1
-
24
-
-
0029459370
-
Serendipitous SEU hardening of resistive load SRAMs
-
R. Koga, et al., "Serendipitous SEU Hardening of Resistive Load SRAMs," RADECS95, 354-358, 1995.
-
(1995)
RADECS95
, pp. 354-358
-
-
Koga, R.1
-
25
-
-
0042193267
-
Proton testing of SEU mitigation methods for the virtex FPGA
-
III
-
C. Carmichael, et al., "Proton Testing of SEU Mitigation Methods for the Virtex FPGA," 2001 MAPLD, III, 23-25, 2001.
-
(2001)
2001 MAPLD
, pp. 23-25
-
-
Carmichael, C.1
|