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Volumn , Issue 536, 2004, Pages 273-278

Comparison of Xilinx Virtex-II FPGA SEE sensitivities to protons and heavy ions

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC NUCLEAR SCATTERING; LINEAR ENERGY TRANSFER (LET); RECONFIGURABLE COMPUTING (RCC); SINGLE EVENT EFFECTS (SEE);

EID: 23844444871     PISSN: 03796566     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (25)
  • 1
    • 66449107834 scopus 로고    scopus 로고
    • Single event upset susceptibility testing of the xilinx virtex-II FPGA
    • C. Yui, G. Swift, and C. Carmichael, "Single Event Upset Susceptibility Testing of the Xilinx Virtex-II FPGA," 2002 MAPLD, IV, 2002.
    • (2002) 2002 MAPLD , vol.4
    • Yui, C.1    Swift, G.2    Carmichael, C.3
  • 3
    • 0019679302 scopus 로고
    • Proton-induced nuclear reactions in silicon
    • P.J. McNulty, et al., "Proton-induced Nuclear Reactions in Silicon," IEEE Trans. Nucl. Sci., 28, 4007-4012, 1981.
    • (1981) IEEE Trans. Nucl. Sci. , vol.28 , pp. 4007-4012
    • McNulty, P.J.1
  • 4
    • 0022921352 scopus 로고
    • Comparison of soft errors induced by heavy ions and protons
    • J.M. Bisgrove, et al., "Comparison of Soft Errors Induced by Heavy Ions and Protons," IEEE Trans. Nucl. Sci., 33, 1571-1576, 1986.
    • (1986) IEEE Trans. Nucl. Sci. , vol.33 , pp. 1571-1576
    • Bisgrove, J.M.1
  • 5
    • 0024171214 scopus 로고
    • SEU test techniques for 256K SRAMs and comparison of upsets induced by heavy ions and protons
    • R. Koga, et al., "SEU Test Techniques for 256K SRAMs and Comparison of Upsets Induced by Heavy Ions and Protons," IEEE Trans. Nucl. Sci., 35, 1638-1643, 1988.
    • (1988) IEEE Trans. Nucl. Sci. , vol.35 , pp. 1638-1643
    • Koga, R.1
  • 6
    • 0024887312 scopus 로고
    • A model for proton-induced SEU
    • T. Bion and J. Bourrieau, "A Model for Proton-induced SEU," IEEE Trans. Nucl. Sci., 36, 2281-2286, 1989.
    • (1989) IEEE Trans. Nucl. Sci. , vol.36 , pp. 2281-2286
    • Bion, T.1    Bourrieau, J.2
  • 7
    • 0032216861 scopus 로고    scopus 로고
    • Internuclear cascade-evaporation model for LET spectra of 200 MeV protons
    • P.M. O'Neill, et al., "Internuclear Cascade-evaporation Model for LET Spectra of 200 MeV Protons," IEEE Trans. Nucl. Sci., 45, 2467-2474, 1998.
    • (1998) IEEE Trans. Nucl. Sci. , vol.45 , pp. 2467-2474
    • O'Neill, P.M.1
  • 8
    • 0028447526 scopus 로고
    • Characterization of proton interactions in electronic components
    • B. Doucin et al., "Characterization of Proton Interactions in Electronic Components," IEEE Trans. Nucl. Sci., 41, 593-600, 1994.
    • (1994) IEEE Trans. Nucl. Sci. , vol.41 , pp. 593-600
    • Doucin, B.1
  • 9
    • 0029462806 scopus 로고
    • A simple model for calculating proton induced SEU
    • J. Barak, et al., "A Simple Model for Calculating Proton Induced SEU," RADECS95, 431-436, 1995.
    • (1995) RADECS95 , pp. 431-436
    • Barak, J.1
  • 11
    • 0031338738 scopus 로고    scopus 로고
    • Proton upset rate simulation by a Monte Carlo method
    • C. Inguimbert, et al., "Proton Upset Rate Simulation by a Monte Carlo Method," IEEE Trans. Nucl. Sci., 44, 2243-2249, 1997
    • (1997) IEEE Trans. Nucl. Sci. , vol.44 , pp. 2243-2249
    • Inguimbert, C.1
  • 12
    • 0030361817 scopus 로고    scopus 로고
    • An empirical model for predicting proton induced upset
    • P. Calvel, et al., "An Empirical Model for Predicting Proton Induced Upset,: IEEE Trans. Nucl. Sci., 43, 2827-2832, 1996.
    • (1996) IEEE Trans. Nucl. Sci. , vol.43 , pp. 2827-2832
    • Calvel, P.1
  • 13
    • 33749382730 scopus 로고
    • The relationship of proton and heavy ion upset thresholds
    • E.L. Petersen, "The Relationship of Proton and Heavy Ion Upset Thresholds," IEEE Trans. Nucl. Sci., 39, 1600-1604, 1992.
    • (1992) IEEE Trans. Nucl. Sci. , vol.39 , pp. 1600-1604
    • Petersen, E.L.1
  • 16
    • 0034290514 scopus 로고    scopus 로고
    • Proton SEU cross sections derived from heavy-ion test data
    • L.D. Edmonds, "Proton SEU Cross Sections Derived from Heavy-ion Test Data," IEEE Trans. Nucl. Sci., 47, 1713-1728, 2000.
    • (2000) IEEE Trans. Nucl. Sci. , vol.47 , pp. 1713-1728
    • Edmonds, L.D.1
  • 17
    • 0030374183 scopus 로고    scopus 로고
    • SEU cross sections derived from a diffusion analysis
    • Dec.
    • L.D. Edmonds, "SEU Cross Sections Derived from a Diffusion Analysis," IEE Trans. Nucl. Sci., 43, 3207-3217, Dec. 1996.
    • (1996) IEE Trans. Nucl. Sci. , vol.43 , pp. 3207-3217
    • Edmonds, L.D.1
  • 18
    • 8344249320 scopus 로고    scopus 로고
    • Empirical modeling of proton induced SEU rates
    • J. Barak, "Empirical Modeling of Proton Induced SEU Rates," RADECS99, 167-172, 2000.
    • (2000) RADECS99 , pp. 167-172
    • Barak, J.1
  • 19
    • 0003651093 scopus 로고    scopus 로고
    • Xilinx, "Virtex-II Platform Handbook," ©2001. http://www.xilinx.com/products/virtex/handbook/index.htm
    • (2001) Virtex-II Platform Handbook
  • 20
    • 0002990769 scopus 로고    scopus 로고
    • SEFI sensitivity in microcircuits
    • R. Koga, et al., "SEFI Sensitivity in Microcircuits," RADECS97, 311-318, 1997.
    • (1997) RADECS97 , pp. 311-318
    • Koga, R.1
  • 22
    • 1242332765 scopus 로고    scopus 로고
    • Charge collection by capacitate influence through isolation oxides
    • V. Ferlet-Cavois, et al., "Charge Collection by Capacitate Influence through Isolation Oxides," IEEE Trans Nucl Sci., 50, 2003.
    • (2003) IEEE Trans Nucl Sci. , vol.50
    • Ferlet-Cavois, V.1
  • 23
    • 0036957460 scopus 로고    scopus 로고
    • Comparison of heavy ion and proton induced single event effects (SEE) sensitivities
    • R.Koga, etal., "Comparison of Heavy Ion and Proton Induced Single Event Effects (SEE) Sensitivities," IEEE Trans Nucl Sci., 49, 3135-3141, 2002.
    • (2002) IEEE Trans Nucl Sci. , vol.49 , pp. 3135-3141
    • Koga, R.1
  • 24
    • 0029459370 scopus 로고
    • Serendipitous SEU hardening of resistive load SRAMs
    • R. Koga, et al., "Serendipitous SEU Hardening of Resistive Load SRAMs," RADECS95, 354-358, 1995.
    • (1995) RADECS95 , pp. 354-358
    • Koga, R.1
  • 25
    • 0042193267 scopus 로고    scopus 로고
    • Proton testing of SEU mitigation methods for the virtex FPGA
    • III
    • C. Carmichael, et al., "Proton Testing of SEU Mitigation Methods for the Virtex FPGA," 2001 MAPLD, III, 23-25, 2001.
    • (2001) 2001 MAPLD , pp. 23-25
    • Carmichael, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.