Electron skirts and X-ray correction: Evaluating methods for rapid discrimination of primary versus secondary X-ray signals in the ESEM

Microscopy and Microanalysis

Volumn 11, Issue SUPPL. 2, 2005, Pages 30-31

  Doehne, Eric ^a  

^a GETTY CONSERVATION INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 23844444565     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927605506822     Document Type: Conference Paper

References (12)

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3. E. Doehne and N. Bower, Microbeam Analysis, 1993. 2(supplement): p. S35-36.
4. B.J. Griffin, R.L. Trautman, and J. Coffey. MAS'93: Microbeam Analysis Society 27th Annual Meeting and AEM. 1993. Los Angeles, CA (USA).
5. E. Doehne, Scanning, 1997. 19(2): p. 75-78.
6. R. Gauvin, Scanning, 1999. 21(6): p. 388-393.
7. J.B. Bilde-Sørensen, Microscopy Today. 1998. p. 10.
8. N.W. Bower, D.C. Stulik, and E. Doehne, Fresenius Journal Analytical Chemistry, 1994. 348(5-6): p. 402-410.
9. T. Rice. 2002. Personal Communication.
10. R.B. Bolon. Microbeam Analysis 1991, the 25th Annual Conference of the Microbeam Analysis Society. 1991. San Jose, CA: San Francisco Press, Inc., Box 6800, San Francisco, CA 94142-6800. USA 1991.
11. E. Doehne, Scanning, 1996. 18(3): p. 164-165.
12. Acknowledgements: The support of Giacomo Chiari and David Carson in this research is gratefully acknowledged. Stimulating discussions with colleagues Robert Carlton and Brendan Griffin have helped to further develop the ideas presented here.