A new correction method for energy-dispersive spectroscopy analysis under humid conditions

Scanning

Volumn 18, Issue 3, 1996, Pages 164-

  Doehne, E ^a  

^a GETTY CONSERVATION INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 1542702334     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (5)

1. Bower NW, Stulik DC, Doehne E: A critical evaluation of the environmental scanning electron microscope for the analysis of paint fragments in art conservation. Fresenius J Anal Chem 348, 402-410 (1994)
2. Danilatos GD: Foundations of environmental scanning electronmicroscopy. Adv Electronics Electron Phys 71, 109-250 (1988)
3. Doehne E, Bower N: Empirical evaluation of the electron skirt in the environmental SEM: Implications for energy dispersive x-ray analysis. Microbeam Anal 2, S35-36 (1993)
4. Griffin BJ, Trautman RI, Coffey J: X-ray resolution at low chamber pressures and chamber gas fluorescence in the ElectroScan ESEM. Microbeam Anal 2, S37-38 (1993)
5. Messier P, Vitale T: Cracking in albumen photographs: An ESEM investigation. Microsc Res Techn 25, 374-383 (1993)